DynUnlock: Unlocking Scan Chains Obfuscated using Dynamic Keys

Nimisha Limaye, Ozgur Sinanoglu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Outsourcing in semiconductor industry opened up venues for faster and cost-effective chip manufacturing. However, this also introduced untrusted entities with malicious intent, to steal intellectual property (IP), overproduce the circuits, insert hardware Trojans, or counterfeit the chips. Recently, a defense is proposed to obfuscate the scan access based on a dynamic key that is initially generated from a secret key but changes in every clock cycle. This defense can be considered as the most rigorous defense among all the scan locking techniques. In this paper, we propose an attack that remodels this defense into one that can be broken by the SAT attack, while we also note that our attack can be adjusted to break other less rigorous (key that is updated less frequently) scan locking techniques as well.

Original languageEnglish (US)
Title of host publicationProceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020
EditorsGiorgio Di Natale, Cristiana Bolchini, Elena-Ioana Vatajelu
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages270-273
Number of pages4
ISBN (Electronic)9783981926347
DOIs
StatePublished - Mar 2020
Event2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020 - Grenoble, France
Duration: Mar 9 2020Mar 13 2020

Publication series

NameProceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020

Conference

Conference2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020
CountryFrance
CityGrenoble
Period3/9/203/13/20

ASJC Scopus subject areas

  • Hardware and Architecture
  • Safety, Risk, Reliability and Quality
  • Modeling and Simulation
  • Electrical and Electronic Engineering

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  • Cite this

    Limaye, N., & Sinanoglu, O. (2020). DynUnlock: Unlocking Scan Chains Obfuscated using Dynamic Keys. In G. Di Natale, C. Bolchini, & E-I. Vatajelu (Eds.), Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020 (pp. 270-273). [9116197] (Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/DATE48585.2020.9116197