TY - GEN
T1 - DynUnlock
T2 - 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020
AU - Limaye, Nimisha
AU - Sinanoglu, Ozgur
N1 - Funding Information:
ACKNOWLEDGEMENT The authors would like to acknowledge Satwik Patnaik for his valuable feedback. This work was supported by New York University NY/Abu Dhabi Center for Cyber Security and Intel Corporation.
Publisher Copyright:
© 2020 EDAA.
PY - 2020/3
Y1 - 2020/3
N2 - Outsourcing in semiconductor industry opened up venues for faster and cost-effective chip manufacturing. However, this also introduced untrusted entities with malicious intent, to steal intellectual property (IP), overproduce the circuits, insert hardware Trojans, or counterfeit the chips. Recently, a defense is proposed to obfuscate the scan access based on a dynamic key that is initially generated from a secret key but changes in every clock cycle. This defense can be considered as the most rigorous defense among all the scan locking techniques. In this paper, we propose an attack that remodels this defense into one that can be broken by the SAT attack, while we also note that our attack can be adjusted to break other less rigorous (key that is updated less frequently) scan locking techniques as well.
AB - Outsourcing in semiconductor industry opened up venues for faster and cost-effective chip manufacturing. However, this also introduced untrusted entities with malicious intent, to steal intellectual property (IP), overproduce the circuits, insert hardware Trojans, or counterfeit the chips. Recently, a defense is proposed to obfuscate the scan access based on a dynamic key that is initially generated from a secret key but changes in every clock cycle. This defense can be considered as the most rigorous defense among all the scan locking techniques. In this paper, we propose an attack that remodels this defense into one that can be broken by the SAT attack, while we also note that our attack can be adjusted to break other less rigorous (key that is updated less frequently) scan locking techniques as well.
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U2 - 10.23919/DATE48585.2020.9116197
DO - 10.23919/DATE48585.2020.9116197
M3 - Conference contribution
AN - SCOPUS:85087382182
T3 - Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020
SP - 270
EP - 273
BT - Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020
A2 - Di Natale, Giorgio
A2 - Bolchini, Cristiana
A2 - Vatajelu, Elena-Ioana
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 9 March 2020 through 13 March 2020
ER -