Efficient RT-level fault diagnosis methodology

Ozgur Sinanoglu, Alex Orailoglu

Research output: Contribution to conferencePaperpeer-review


Increasing IC densities necessitate diagnosis methodologies with enhanced defect locating capabilities. Yet the computational effort expended in extracting diagnostic information and the stringent storage requirements constitute major concerns due to the tremendous number of faults in typical ICs. In this paper, we propose an RT-level diagnosis methodology capable of responding to these challenges. In the proposed scheme, diagnostic information is computed on a grouped fault effect basis, enhancing both the storage and the computational aspects. The fault effect grouping criteria are identified based on a module structure analysis, improving the propagation ability of the diagnostic information through RT modules. Experimental results show that the proposed methodology provides superior speed-ups and significant diagnostic information compression at no sacrifice in diagnostic resolution, compared to the existing gate-level diagnosis approaches.

Original languageEnglish (US)
Number of pages6
StatePublished - 2004
EventProceedings of the ASP - DAC 2004 Asia and South Pacific Design Automation Conference - 2004 - Yokohama, Japan
Duration: Jan 27 2004Jan 30 2004


OtherProceedings of the ASP - DAC 2004 Asia and South Pacific Design Automation Conference - 2004

ASJC Scopus subject areas

  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering


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