Elastic property of vertically aligned nanowires

Jinhui Song, Xudong Wang, Elisa Riedo, Zhong L. Wang

Research output: Contribution to journalArticlepeer-review


An atomic force microscopy (AFM) based technique is demonstrated for measuring the elastic modulus of individual nanowires/nanotubes aligned on a solid substrate without destructing or manipulating the sample. By simultaneously acquiring the topography and lateral force image of the aligned nanowires in the AFM contacting mode, the elastic modulus of the individual nanowires in the image has been derived. The measurement is based on quantifying the lateral force required to induce the maximal deflection of the nanowire where the AFM tip was scanning over the surface in contact mode. For the [0001] ZnO nanowires/nanorods grown on a sapphire surface with an average diameter of 45 nm, the elastic modulus is measured to be 29 ± 8 GPa.

Original languageEnglish (US)
Pages (from-to)1954-1958
Number of pages5
JournalNano Letters
Issue number10
StatePublished - Oct 2005

ASJC Scopus subject areas

  • Bioengineering
  • General Chemistry
  • General Materials Science
  • Condensed Matter Physics
  • Mechanical Engineering


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