Electrical characterization of silicon nanocrystal films

Neema Rastgar; Dave Rowe; Lance M. Wheeler; Eray Aydil; Uwe Kortshagen

Electrical characterization of silicon nanocrystal films

Neema Rastgar, Dave Rowe, Lance M. Wheeler, Eray Aydil, Uwe Kortshagen

Chemical and Biomolecular Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting
Publisher	AIChE
Pages	154-155
Number of pages	2
ISBN (Print)	9781618397294
State	Published - 2011
Event	Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting - Minneapolis, United States Duration: Oct 16 2011 → Oct 21 2016

Publication series

Name	Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting
Volume	1

Other

Other	Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting
Country/Territory	United States
City	Minneapolis
Period	10/16/11 → 10/21/16

ASJC Scopus subject areas

Chemical Health and Safety
Safety, Risk, Reliability and Quality
Safety Research

Cite this

Rastgar, N., Rowe, D., Wheeler, L. M., Aydil, E., & Kortshagen, U. (2011). Electrical characterization of silicon nanocrystal films. In Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting (pp. 154-155). (Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting; Vol. 1). AIChE.

Electrical characterization of silicon nanocrystal films. / Rastgar, Neema; Rowe, Dave; Wheeler, Lance M. et al.

Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting. AIChE, 2011. p. 154-155 (Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting; Vol. 1).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Rastgar, N, Rowe, D, Wheeler, LM, Aydil, E & Kortshagen, U 2011, Electrical characterization of silicon nanocrystal films. in Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting. Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting, vol. 1, AIChE, pp. 154-155, Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting, Minneapolis, United States, 10/16/11.

@inproceedings{75cf9eefbe4944d78eee372273647f25,

title = "Electrical characterization of silicon nanocrystal films",

author = "Neema Rastgar and Dave Rowe and Wheeler, {Lance M.} and Eray Aydil and Uwe Kortshagen",

note = "Funding Information: This work was supported primarily by the MRSEC Program of the National Science Foundation under Award Number DMR-0819885.; Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting ; Conference date: 16-10-2011 Through 21-10-2016",

year = "2011",

language = "English (US)",

isbn = "9781618397294",

series = "Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting",

publisher = "AIChE",

pages = "154--155",

booktitle = "Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting",

}

TY - GEN

T1 - Electrical characterization of silicon nanocrystal films

AU - Rastgar, Neema

AU - Rowe, Dave

AU - Wheeler, Lance M.

AU - Aydil, Eray

AU - Kortshagen, Uwe

N1 - Funding Information: This work was supported primarily by the MRSEC Program of the National Science Foundation under Award Number DMR-0819885.

PY - 2011

Y1 - 2011

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UR - http://www.scopus.com/inward/citedby.url?scp=85054680823&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:85054680823

SN - 9781618397294

T3 - Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting

SP - 154

EP - 155

BT - Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting

PB - AIChE

T2 - Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting

Y2 - 16 October 2011 through 21 October 2016

ER -

Electrical characterization of silicon nanocrystal films

Publication series

Other

ASJC Scopus subject areas

Other files and links

Cite this