Electrical characterization of silicon nanocrystal films

Neema Rastgar; Dave Rowe; Lance M. Wheeler; Eray Aydil; Uwe Kortshagen

Electrical characterization of silicon nanocrystal films

Neema Rastgar, Dave Rowe, Lance M. Wheeler, Eray Aydil, Uwe Kortshagen

Chemical and Biomolecular Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting
Publisher	AIChE
Pages	154-155
Number of pages	2
ISBN (Print)	9781618397294
State	Published - 2011
Event	Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting - Minneapolis, United States Duration: Oct 16 2011 → Oct 21 2016

Publication series

Name	Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting
Volume	1

Other

Other	Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting
Country	United States
City	Minneapolis
Period	10/16/11 → 10/21/16

ASJC Scopus subject areas

Chemical Health and Safety
Safety, Risk, Reliability and Quality
Safety Research

Cite this

Rastgar, N., Rowe, D., Wheeler, L. M., Aydil, E., & Kortshagen, U. (2011). Electrical characterization of silicon nanocrystal films. In Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting (pp. 154-155). (Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting; Vol. 1). AIChE.

Electrical characterization of silicon nanocrystal films. / Rastgar, Neema; Rowe, Dave; Wheeler, Lance M.; Aydil, Eray; Kortshagen, Uwe.

Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting. AIChE, 2011. p. 154-155 (Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting; Vol. 1).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Rastgar, N, Rowe, D, Wheeler, LM, Aydil, E & Kortshagen, U 2011, Electrical characterization of silicon nanocrystal films. in Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting. Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting, vol. 1, AIChE, pp. 154-155, Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting, Minneapolis, United States, 10/16/11.

Rastgar, Neema ; Rowe, Dave ; Wheeler, Lance M. ; Aydil, Eray ; Kortshagen, Uwe. / Electrical characterization of silicon nanocrystal films. Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting. AIChE, 2011. pp. 154-155 (Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting).

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title = "Electrical characterization of silicon nanocrystal films",

author = "Neema Rastgar and Dave Rowe and Wheeler, {Lance M.} and Eray Aydil and Uwe Kortshagen",

note = "Funding Information: This work was supported primarily by the MRSEC Program of the National Science Foundation under Award Number DMR-0819885.; Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting ; Conference date: 16-10-2011 Through 21-10-2016",

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BT - Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting

PB - AIChE

T2 - Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting

Y2 - 16 October 2011 through 21 October 2016

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Electrical characterization of silicon nanocrystal films

Publication series

Other

ASJC Scopus subject areas

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Cite this