Electromigration reliability enhancement via bus activity distribution

Aurobindo Dasgupta, Ramesh Karri

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Electromigration induced degradation in integrated circuits has been accelerated by continuous scaling of device dimensions. We present a methodology for synthesizing high-reliability and low-energy microarchitectures at the RT level by judiciously binding and scheduling the data transfers of a control data flow graph (CDFG) representation of the application onto the buses in the microarchitecture. The proposed method accounts for correlations between data transfers and the constraints on the number of buses, area and delay.

Original languageEnglish (US)
Title of host publicationProceedings - Design Automation Conference
PublisherIEEE
Pages353-356
Number of pages4
StatePublished - 1996
EventProceedings of the 1996 33rd Annual Design Automation Conference - Las Vegas, NV, USA
Duration: Jun 3 1996Jun 7 1996

Other

OtherProceedings of the 1996 33rd Annual Design Automation Conference
CityLas Vegas, NV, USA
Period6/3/966/7/96

ASJC Scopus subject areas

  • Hardware and Architecture
  • Control and Systems Engineering

Fingerprint Dive into the research topics of 'Electromigration reliability enhancement via bus activity distribution'. Together they form a unique fingerprint.

  • Cite this

    Dasgupta, A., & Karri, R. (1996). Electromigration reliability enhancement via bus activity distribution. In Proceedings - Design Automation Conference (pp. 353-356). IEEE.