Abstract
The author is studying the electron-impact dissociation of NF3, CF4, SF6, BCl3, and CCl2F2, which are among in the most commonly employed reactive constituents of etchant gas plasmas. The objective is to determine absolute cross sections and appearance potentials for the formation of the various radiating, metastable, and neutral ground-state fragments that are produced by controlled electron-impact dissociation of these molecules. Experimental techniques include electron and optical emission spectroscopy, mass spectroscopy, time-of-flight (TOF), and laser-induced-fluorescence techniques. Results on molecular emissions in the near ultraviolet region of the the optical spectrum are reported. These include the emission of the BCl A → X band system from BCl3, the CCl A → X and CCl+ A → X band systems from CCl2F2, and continuous UV emissions following dissociative electron impact on SF6 and NF3.
Original language | English (US) |
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Title of host publication | IEEE Int Conf Plasma Sci 1989 |
Editors | Anon |
Place of Publication | Piscataway, NJ, United States |
Publisher | Publ by IEEE |
Pages | 90-91 |
Number of pages | 2 |
State | Published - 1989 |
Event | IEEE International Conference on Plasma Science 1989 - Buffalo, NY, USA Duration: May 22 1989 → May 24 1989 |
Other
Other | IEEE International Conference on Plasma Science 1989 |
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City | Buffalo, NY, USA |
Period | 5/22/89 → 5/24/89 |
ASJC Scopus subject areas
- General Engineering