Electron-impact ionization cross-section of argon (σn+, n = 7,8)

D. P. Almeida; K. H. Becker; H. Deutsch

doi:10.1016/s0168-1176(96)04543-0

Electron-impact ionization cross-section of argon (σ_n+, n = 7,8)

D. P. Almeida, K. H. Becker, H. Deutsch

Research output: Contribution to journal › Article › peer-review

Abstract

Multiple ionization cross-sections of argon (Ar-Arⁿ⁺, with n = 7,8) by electron impact are measured for energies ranging from threshold up to 3000 eV. The data were obtained by a time-of-flight mass-to-charge spectrometric technique. A comparison with other experimental data and with semi-empirical calculations is presented. The integrated oscillator strength (M₇₊²) for the production of Ar⁷⁺ was determined.

Original language	English (US)
Pages (from-to)	39-45
Number of pages	7
Journal	International Journal of Mass Spectrometry and Ion Processes
Volume	163
Issue number	1-2
DOIs	https://doi.org/10.1016/s0168-1176(96)04543-0
State	Published - 1997

Keywords

Argon
Electron impact ionization
Mass-to-charge spectrometry
Multiple ionization cross-section
Time-of-flight

ASJC Scopus subject areas

Spectroscopy

Access to Document

10.1016/s0168-1176(96)04543-0

Cite this

@article{d18b865f94de46f79ba44260105e8779,

title = "Electron-impact ionization cross-section of argon (σn+, n = 7,8)",

abstract = "Multiple ionization cross-sections of argon (Ar-Arn+, with n = 7,8) by electron impact are measured for energies ranging from threshold up to 3000 eV. The data were obtained by a time-of-flight mass-to-charge spectrometric technique. A comparison with other experimental data and with semi-empirical calculations is presented. The integrated oscillator strength (M7+2) for the production of Ar7+ was determined.",

keywords = "Argon, Electron impact ionization, Mass-to-charge spectrometry, Multiple ionization cross-section, Time-of-flight",

author = "Almeida, {D. P.} and Becker, {K. H.} and H. Deutsch",

note = "Funding Information: We acknowledget he useful cooperation of Dr W. Fisher. This work was partially supported by the UniversidadeF ederald o Rio de Janeiro and ConselhoN acionalde Pesquisa( CNPq), Brazil.",

year = "1997",

doi = "10.1016/s0168-1176(96)04543-0",

language = "English (US)",

volume = "163",

pages = "39--45",

journal = "International Journal of Mass Spectrometry and Ion Processes",

issn = "0168-1176",

publisher = "Elsevier B.V.",

number = "1-2",

}

TY - JOUR

T1 - Electron-impact ionization cross-section of argon (σn+, n = 7,8)

AU - Almeida, D. P.

AU - Becker, K. H.

AU - Deutsch, H.

N1 - Funding Information: We acknowledget he useful cooperation of Dr W. Fisher. This work was partially supported by the UniversidadeF ederald o Rio de Janeiro and ConselhoN acionalde Pesquisa( CNPq), Brazil.

PY - 1997

Y1 - 1997

N2 - Multiple ionization cross-sections of argon (Ar-Arn+, with n = 7,8) by electron impact are measured for energies ranging from threshold up to 3000 eV. The data were obtained by a time-of-flight mass-to-charge spectrometric technique. A comparison with other experimental data and with semi-empirical calculations is presented. The integrated oscillator strength (M7+2) for the production of Ar7+ was determined.

AB - Multiple ionization cross-sections of argon (Ar-Arn+, with n = 7,8) by electron impact are measured for energies ranging from threshold up to 3000 eV. The data were obtained by a time-of-flight mass-to-charge spectrometric technique. A comparison with other experimental data and with semi-empirical calculations is presented. The integrated oscillator strength (M7+2) for the production of Ar7+ was determined.

KW - Argon

KW - Electron impact ionization

KW - Mass-to-charge spectrometry

KW - Multiple ionization cross-section

KW - Time-of-flight

UR - http://www.scopus.com/inward/record.url?scp=0009004382&partnerID=8YFLogxK

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U2 - 10.1016/s0168-1176(96)04543-0

DO - 10.1016/s0168-1176(96)04543-0

M3 - Article

AN - SCOPUS:0009004382

SN - 0168-1176

VL - 163

SP - 39

EP - 45

JO - International Journal of Mass Spectrometry and Ion Processes

JF - International Journal of Mass Spectrometry and Ion Processes

IS - 1-2

ER -