Ellipses from triangles

M. Cicconet, K. Gunsalus, D. Geiger, M. Werman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present an ellipse finding and fitting algorithm that uses points and tangents, rather than just points, as the basic unit of information. These units are analyzed in a hierarchy: points with tangents are paired into triangles in the first layer and pairs of triangles in the second layer vote for ellipse centers. The remaining parameters are estimated via robust linear algebra: eigen-decomposition and iteratively reweighed least squares. Our method outperforms the state-of-the-art approach in synthetic images and microscopic images of cells.

Original languageEnglish (US)
Title of host publication2014 IEEE International Conference on Image Processing, ICIP 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages3626-3630
Number of pages5
ISBN (Electronic)9781479957514
DOIs
StatePublished - Jan 28 2014

Publication series

Name2014 IEEE International Conference on Image Processing, ICIP 2014

Keywords

  • cell counting
  • ellipse detection
  • ellipse fitting
  • image analysis
  • pattern recognition

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition

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