Exchange biasing in polycrystalline thin film microstructures

J. Yu; A. D. Kent; S. S.P. Parkin

doi:10.1063/1.373244

Exchange biasing in polycrystalline thin film microstructures

J. Yu, A. D. Kent, S. S.P. Parkin

Research output: Contribution to journal › Conference article › peer-review

Abstract

The effect of lateral element size, shape, and ferromagnetic layer thickness on exchange biasing in polycrystalline IrMn/CoFe thin film elements has been studied. Magnetic hysteresis loop measurements and magnetic force microscopy imaging have been used to elucidate the basic micromagnetic behavior. Magnetic imaging of micron scale elements illustrates that the magnetization reversal modes change significantly from those of unbiased ferromagnetic elements.

Original language	English (US)
Pages (from-to)	5049-5051
Number of pages	3
Journal	Journal of Applied Physics
Volume	87
Issue number	9 II
DOIs	https://doi.org/10.1063/1.373244
State	Published - May 2000
Event	44th Annual Conference on Magnetism and Magnetic Materials - San Jose, CA, United States Duration: Nov 15 1999 → Nov 18 1999

ASJC Scopus subject areas

General Physics and Astronomy

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10.1063/1.373244

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title = "Exchange biasing in polycrystalline thin film microstructures",

abstract = "The effect of lateral element size, shape, and ferromagnetic layer thickness on exchange biasing in polycrystalline IrMn/CoFe thin film elements has been studied. Magnetic hysteresis loop measurements and magnetic force microscopy imaging have been used to elucidate the basic micromagnetic behavior. Magnetic imaging of micron scale elements illustrates that the magnetization reversal modes change significantly from those of unbiased ferromagnetic elements.",

author = "J. Yu and Kent, {A. D.} and Parkin, {S. S.P.}",

year = "2000",

month = may,

doi = "10.1063/1.373244",

language = "English (US)",

volume = "87",

pages = "5049--5051",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics Publising LLC",

number = "9 II",

note = "44th Annual Conference on Magnetism and Magnetic Materials ; Conference date: 15-11-1999 Through 18-11-1999",

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AU - Yu, J.

AU - Kent, A. D.

AU - Parkin, S. S.P.

PY - 2000/5

Y1 - 2000/5

N2 - The effect of lateral element size, shape, and ferromagnetic layer thickness on exchange biasing in polycrystalline IrMn/CoFe thin film elements has been studied. Magnetic hysteresis loop measurements and magnetic force microscopy imaging have been used to elucidate the basic micromagnetic behavior. Magnetic imaging of micron scale elements illustrates that the magnetization reversal modes change significantly from those of unbiased ferromagnetic elements.

AB - The effect of lateral element size, shape, and ferromagnetic layer thickness on exchange biasing in polycrystalline IrMn/CoFe thin film elements has been studied. Magnetic hysteresis loop measurements and magnetic force microscopy imaging have been used to elucidate the basic micromagnetic behavior. Magnetic imaging of micron scale elements illustrates that the magnetization reversal modes change significantly from those of unbiased ferromagnetic elements.

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DO - 10.1063/1.373244

M3 - Conference article

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VL - 87

SP - 5049

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JF - Journal of Applied Physics

IS - 9 II

T2 - 44th Annual Conference on Magnetism and Magnetic Materials

Y2 - 15 November 1999 through 18 November 1999

ER -

Exchange biasing in polycrystalline thin film microstructures

Abstract

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