Exchange biasing in polycrystalline thin film microstructures

J. Yu, A. D. Kent, S. S.P. Parkin

    Research output: Contribution to journalConference articlepeer-review

    Abstract

    The effect of lateral element size, shape, and ferromagnetic layer thickness on exchange biasing in polycrystalline IrMn/CoFe thin film elements has been studied. Magnetic hysteresis loop measurements and magnetic force microscopy imaging have been used to elucidate the basic micromagnetic behavior. Magnetic imaging of micron scale elements illustrates that the magnetization reversal modes change significantly from those of unbiased ferromagnetic elements.

    Original languageEnglish (US)
    Pages (from-to)5049-5051
    Number of pages3
    JournalJournal of Applied Physics
    Volume87
    Issue number9 II
    DOIs
    StatePublished - May 2000
    Event44th Annual Conference on Magnetism and Magnetic Materials - San Jose, CA, United States
    Duration: Nov 15 1999Nov 18 1999

    ASJC Scopus subject areas

    • Physics and Astronomy(all)

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