Exchange coupling in FeTaN/FeSm/FeTaN multilayers: A Kerr effect study

Gianluca Gubbiotti, Giovanni Carlotti, Marco Madami, James Weston, Giovanni Zangari, Paolo Vavassori, J. A. Barnard

Research output: Contribution to journalConference articlepeer-review

Abstract

The dependence of the interlayer coupling on both the soft and hard layer thickness in FeTaN/FeTaN multilayers, deposited by DC magnetron sputtering was investigated. The layering was designed in that the basic unit in Soft-Hard-Soft (S-H-S) for one layer and N×(S-H-S) for N layers. The thickness of the elemental layers in each sample showed the hysteresis loops measured by MOKE along the easy in-plane direction for all the multilayers.

Original languageEnglish (US)
Pages (from-to)ES03
JournalDigests of the Intermag Conference
StatePublished - 2002
Event2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands
Duration: Apr 28 2002May 2 2002

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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