Exploiting program-level masking and error propagation for constrained reliability optimization

Muhammad Shafique, Semeen Rehman, Pau Vilimelis Aceituno, Jörg Henkel

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Since embedded systems design involves stringent design constraints, designing a system for reliability requires optimization under tolerable overhead constraints. This paper presents a novel reliability-driven compilation scheme for software program reliability optimization under tolerable overhead constraints. Our scheme exploits program-level error masking and propagation properties to perform reliability-driven prioritization of instructions and selective protection during compilation. To enable this, we develop statistical models for estimating error masking and propagation probabilities. Our scheme provides significant improvement in reliability efficiency (avg. 30%-60%) compared to state-of-the-art program-level protection schemes.

Original languageEnglish (US)
Title of host publicationProceedings of the 50th Annual Design Automation Conference, DAC 2013
DOIs
StatePublished - 2013
Event50th Annual Design Automation Conference, DAC 2013 - Austin, TX, United States
Duration: May 29 2013Jun 7 2013

Publication series

NameProceedings - Design Automation Conference
ISSN (Print)0738-100X

Other

Other50th Annual Design Automation Conference, DAC 2013
CountryUnited States
CityAustin, TX
Period5/29/136/7/13

ASJC Scopus subject areas

  • Computer Science Applications
  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Modeling and Simulation

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