Exploiting program-level masking and error propagation for constrained reliability optimization

Muhammad Shafique; Semeen Rehman; Pau Vilimelis Aceituno; Jörg Henkel

doi:10.1145/2463209.2488755

Exploiting program-level masking and error propagation for constrained reliability optimization

Muhammad Shafique, Semeen Rehman, Pau Vilimelis Aceituno, Jörg Henkel

Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Since embedded systems design involves stringent design constraints, designing a system for reliability requires optimization under tolerable overhead constraints. This paper presents a novel reliability-driven compilation scheme for software program reliability optimization under tolerable overhead constraints. Our scheme exploits program-level error masking and propagation properties to perform reliability-driven prioritization of instructions and selective protection during compilation. To enable this, we develop statistical models for estimating error masking and propagation probabilities. Our scheme provides significant improvement in reliability efficiency (avg. 30%-60%) compared to state-of-the-art program-level protection schemes.

Original language	English (US)
Title of host publication	Proceedings of the 50th Annual Design Automation Conference, DAC 2013
DOIs	https://doi.org/10.1145/2463209.2488755
State	Published - 2013
Event	50th Annual Design Automation Conference, DAC 2013 - Austin, TX, United States Duration: May 29 2013 → Jun 7 2013

Publication series

Name	Proceedings - Design Automation Conference
ISSN (Print)	0738-100X

Other

Other	50th Annual Design Automation Conference, DAC 2013
Country/Territory	United States
City	Austin, TX
Period	5/29/13 → 6/7/13

ASJC Scopus subject areas

Computer Science Applications
Control and Systems Engineering
Electrical and Electronic Engineering
Modeling and Simulation

Access to Document

10.1145/2463209.2488755

Cite this

Exploiting program-level masking and error propagation for constrained reliability optimization. / Shafique, Muhammad; Rehman, Semeen; Aceituno, Pau Vilimelis et al.

Proceedings of the 50th Annual Design Automation Conference, DAC 2013. 2013. 17 (Proceedings - Design Automation Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Shafique, M, Rehman, S, Aceituno, PV & Henkel, J 2013, Exploiting program-level masking and error propagation for constrained reliability optimization. in Proceedings of the 50th Annual Design Automation Conference, DAC 2013., 17, Proceedings - Design Automation Conference, 50th Annual Design Automation Conference, DAC 2013, Austin, TX, United States, 5/29/13. https://doi.org/10.1145/2463209.2488755

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AB - Since embedded systems design involves stringent design constraints, designing a system for reliability requires optimization under tolerable overhead constraints. This paper presents a novel reliability-driven compilation scheme for software program reliability optimization under tolerable overhead constraints. Our scheme exploits program-level error masking and propagation properties to perform reliability-driven prioritization of instructions and selective protection during compilation. To enable this, we develop statistical models for estimating error masking and propagation probabilities. Our scheme provides significant improvement in reliability efficiency (avg. 30%-60%) compared to state-of-the-art program-level protection schemes.

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Exploiting program-level masking and error propagation for constrained reliability optimization

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