TY - GEN
T1 - Extending residue-based fault tolerance to encrypted computation
AU - Tsoutsos, Nektarios Georgios
AU - Maniatakos, Michail
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/11/30
Y1 - 2015/11/30
N2 - In this work we adapt residue numbering and modular arithmetic, combining them with the intrinsic properties of partial homomorphic encryption algorithms, in order to propose an efficient fault tolerance framework specifically tailored to encrypted computation. Our approach can be easily integrated to such systems and protect the individual processing components, such as the ALU, the memory, and the outputs. Experimental results demonstrate that the proposed methodology offers more than 99.9% fault coverage for single bit-flips and clustered multiple bit upsets, incurring a runtime overhead of up to 8%. Compared to resource duplication approaches, our framework incurs approximately 47% less area overhead.
AB - In this work we adapt residue numbering and modular arithmetic, combining them with the intrinsic properties of partial homomorphic encryption algorithms, in order to propose an efficient fault tolerance framework specifically tailored to encrypted computation. Our approach can be easily integrated to such systems and protect the individual processing components, such as the ALU, the memory, and the outputs. Experimental results demonstrate that the proposed methodology offers more than 99.9% fault coverage for single bit-flips and clustered multiple bit upsets, incurring a runtime overhead of up to 8%. Compared to resource duplication approaches, our framework incurs approximately 47% less area overhead.
UR - http://www.scopus.com/inward/record.url?scp=84958637240&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84958637240&partnerID=8YFLogxK
U2 - 10.1109/TEST.2015.7342419
DO - 10.1109/TEST.2015.7342419
M3 - Conference contribution
AN - SCOPUS:84958637240
T3 - Proceedings - International Test Conference
BT - International Test Conference 2015, ITC 2015 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 46th IEEE International Test Conference, ITC 2015
Y2 - 6 October 2015 through 8 October 2015
ER -