Fabrication and characterization of Fe81Ga19 thin films

James L. Weston, Alejandro Butera, Tommaso Lograsso, M. Shamsuzzoha, Iulica Zana, Giovanni Zangari, J. Barnard

Research output: Contribution to journalConference articlepeer-review

Abstract

Fabrication and characterization of Fe81Ga19 thin films were studied using sputter deposition onto epitaxial copper films. The presence of the epitaxial variants in the thick films complicate the analysis of the magnetic measurements. Measurements as function of the in-plane angle show a single variant in thinner films.

Original languageEnglish (US)
Pages (from-to)AE03
JournalDigests of the Intermag Conference
StatePublished - 2002
Event2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands
Duration: Apr 28 2002May 2 2002

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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