Fabrication and characterization of Fe81Ga19 thin films were studied using sputter deposition onto epitaxial copper films. The presence of the epitaxial variants in the thick films complicate the analysis of the magnetic measurements. Measurements as function of the in-plane angle show a single variant in thinner films.
|Original language||English (US)|
|Journal||Digests of the Intermag Conference|
|State||Published - 2002|
|Event||2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands|
Duration: Apr 28 2002 → May 2 2002
ASJC Scopus subject areas
- Electrical and Electronic Engineering