@inproceedings{a2b3c3c20be94dfbbd5ed2ffe3c2f27b,
title = "Fault-detection relying on set-membership techniques for an Atomic Force Microscope",
abstract = "The objective of this article is the detection of tip-fractures as faults in the normal operation of an Atomic Force Microscope (AFM), where the system's characteristics (damping, tip-radius) vary. The system is modeled as a vibrating cantilever beam whose deflection can be measured. The measurements are assumed to be corrupted by noise within a priori known magnitude. The certainty sets within which the nominal time-varying parameters of the AFM reside are computed via a variation of an ellipsoidal Set Membership Identification technique. The fault is captured at the time instant of the existence of an outlier-measurement.",
keywords = "Fault detection, Fault isolation, Resonance microscopy",
author = "Vasso Reppa and Anthony Tzes",
year = "2009",
doi = "10.3182/20090630-4-ES-2003.0181",
language = "English (US)",
isbn = "9783902661463",
series = "IFAC Proceedings Volumes (IFAC-PapersOnline)",
pages = "1186--1191",
booktitle = "SAFEPROCESS'09 - 7th IFAC International Symposium on Fault Detection, Supervision and Safety of Technical Systems, Proceedings",
note = "7th IFAC International Symposium on Fault Detection, Supervision and Safety of Technical Systems, SAFEPROCESS'09 ; Conference date: 30-06-2009 Through 03-07-2009",
}