TY - GEN
T1 - Fault-detection relying on set-membership techniques for an Atomic Force Microscope
AU - Reppa, Vasso
AU - Tzes, Anthony
N1 - Funding Information:
ϕThis work was partially supported by University of Patras’ K. Karatheodoris C.152 research initiative program
PY - 2009
Y1 - 2009
N2 - The objective of this article is the detection of tip-fractures as faults in the normal operation of an Atomic Force Microscope (AFM), where the system's characteristics (damping, tip-radius) vary. The system is modeled as a vibrating cantilever beam whose deflection can be measured. The measurements are assumed to be corrupted by noise within a priori known magnitude. The certainty sets within which the nominal time-varying parameters of the AFM reside are computed via a variation of an ellipsoidal Set Membership Identification technique. The fault is captured at the time instant of the existence of an outlier-measurement.
AB - The objective of this article is the detection of tip-fractures as faults in the normal operation of an Atomic Force Microscope (AFM), where the system's characteristics (damping, tip-radius) vary. The system is modeled as a vibrating cantilever beam whose deflection can be measured. The measurements are assumed to be corrupted by noise within a priori known magnitude. The certainty sets within which the nominal time-varying parameters of the AFM reside are computed via a variation of an ellipsoidal Set Membership Identification technique. The fault is captured at the time instant of the existence of an outlier-measurement.
KW - Fault detection
KW - Fault isolation
KW - Resonance microscopy
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U2 - 10.3182/20090630-4-ES-2003.0181
DO - 10.3182/20090630-4-ES-2003.0181
M3 - Conference contribution
AN - SCOPUS:79551704527
SN - 9783902661463
T3 - IFAC Proceedings Volumes (IFAC-PapersOnline)
SP - 1186
EP - 1191
BT - SAFEPROCESS'09 - 7th IFAC International Symposium on Fault Detection, Supervision and Safety of Technical Systems, Proceedings
T2 - 7th IFAC International Symposium on Fault Detection, Supervision and Safety of Technical Systems, SAFEPROCESS'09
Y2 - 30 June 2009 through 3 July 2009
ER -