Abstract
A fault-secure datapath either generates a correct result or signals an error. This paper presents a register transfer level concurrent error detection (CED) technique that uses hybrid time and hardware redundancy to optimize the time and area overhead associated with fault security. The proposed technique combines the idle computation cycles in a datapath with selective breaking of data dependences of the normal computation. Designers can tradeoff time and hardware overhead by varying these design parameters. We present an algorithm to synthesize fault secure designs and validate it using Synopsys' Behavioral Compiler.
Original language | English (US) |
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Pages (from-to) | 1476-1484 |
Number of pages | 9 |
Journal | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems |
Volume | 23 |
Issue number | 10 |
DOIs | |
State | Published - Oct 2004 |
Keywords
- Concurrent error detection (CED)
- Fault secure datapath
- Register transfer (RT) level synthesis
- Single event upset (SEU)
ASJC Scopus subject areas
- Software
- Computer Graphics and Computer-Aided Design
- Electrical and Electronic Engineering