Fault tolerant nanoelectronic processor architectures

Wenjing Rao, Alex Orailoglu, Ramesh Karri

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper we propose a fault-tolerant processor architecture and an associated fault-tolerant computation model capable of fault tolerance in the nanoelectronic environment that is characterized by high and time varying fault rates. The proposed fault tolerant processor architecture not only guarantees the correctness of computation but also is exible in that it dynamically trades-off computation resources and performance. The core of the architecture is a decentralized instruction control unit called the voter that achieves both fault tolerance and the maximum parallel execution of instructions by exploiting the abundant computational resources provided by nanotechnologies. Although the result of each instruction needs to be con rmed by executing it on multiple computation units, multiple uncon rmed instructions can proceed as speculative branches. The voter implements a hardware-frugal computation unit allocation algorithm to organize the redundant computations and to dynamically control the growth of speculative branches.

Original languageEnglish (US)
Title of host publicationProceedings of the 2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages311-316
Number of pages6
ISBN (Print)0780387368, 9780780387362
DOIs
StatePublished - 2005
Event2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005 - Shanghai, China
Duration: Jan 18 2005Jan 21 2005

Publication series

NameProceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
Volume1

Other

Other2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005
Country/TerritoryChina
CityShanghai
Period1/18/051/21/05

ASJC Scopus subject areas

  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering

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