Fault tolerant Quantum Cellular Array (QCA) design using Triple Modular Redundancy with Shifted Operands

Tongquan Wei, Kaijie Wu, Ramesh Karri, Alex Orailoglu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Due to their extremely small feature sizes and ultra low power consumption, Quantum-dot Cellular Automata (QCA) technology is projected to be a promising nanotechnology. However, in nanotechnologies, manufacture time defect levels and operational time fault rates are expected to be quite high. Straightforward Triple Modular Redundancy (TMR) based fault tolerance is inappropriate for QCA nanotechnology since wire delays dominate the logic delays and faults in wires dominate the faults in a QCA based design. Furthermore, long wires are necessary in TMR based designs. In this paper we show that fault-tolerance can be obtained by using TMR with Shifted Operands (TMRSO). TMRSO uses shorter wires of QCA cells and exploits the self-latching property of clocked QCA arrays to provide the same level of fault tolerance capability as straightforward TMR while being significantly faster and smaller. This technique can be applied to a variety of operations; we have validated TMRSO on adders. Implementation results obtained using QCADesigner [6] show that an 8-bit adder using TMRSO has more than 50% area reduction and more than 100% throughput improvement when compared to a TMR implementation.

Original languageEnglish (US)
Title of host publicationProceedings of the 2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1192-1195
Number of pages4
ISBN (Print)0780387368, 9780780387362
DOIs
StatePublished - 2005
Event2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005 - Shanghai, China
Duration: Jan 18 2005Jan 21 2005

Publication series

NameProceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
Volume2

Other

Other2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005
Country/TerritoryChina
CityShanghai
Period1/18/051/21/05

ASJC Scopus subject areas

  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering

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