Abstract
This paper discusses two techniques that have, at first sight, completely different applications: photon emission microscopy (PEM) and micro-Raman spectroscopy (μRS). We explain the principles of these techniques, their application domain, and we will show that they can in some cases offer complementary information, and be applied to common or similar problems.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 59-65 |
| Number of pages | 7 |
| Journal | EPJ Applied Physics |
| Volume | 27 |
| Issue number | 1-3 |
| DOIs | |
| State | Published - Jul 2004 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Instrumentation
- Condensed Matter Physics