High-reliability, low-energy microarchitecture synthesis

Keyphrases

• Continuous Scaling 33%
• Electromigration 66%
• Failure Phenomena 33%
• Major Failure 33%
• Metal Line 33%
• Reliability Degradation 33%

Engineering

• Electromigration 100%
• Major Failure 50%
• Structural Damage 50%

Material Science

• Density 50%
• Electronic Circuit 100%