High resolution multiple electron impact ionisation of He, Ne, Ar, Kr and Xe atoms close to threshold: Appearance energies and Wannier exponents

B. Gstir, S. Denifl, G. Hanel, M. Rümmele, T. Fiegele, M. Stano, L. Feketeova, S. Matejcik, K. Becker, P. Scheier, T. D. Märk

Research output: Contribution to journalConference article

Abstract

We have determined appearance energies AE(Xn+/X) for the formation of multiply charged He, Ne, Ar, Kr and Xe ions up to charge state n = 2 (He), n = 4 (Ne), n = 6 (Ar), n = 6 (Kr) and n = 8 (Xe) using a recently commissioned high-resolution electron impact ionization mass spectrometer. The data analysis is based on the Marquart-Levenberg algorithm, involving an iterative, non-linear least-squares fitting of the threshold data assuming a 2-function or a 3-function fit based on a Wannier-type power law. This allows us to extract the relevant AEs and corresponding Wannier exponents.

Original languageEnglish (US)
Pages (from-to)413-416
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume205
DOIs
StatePublished - May 2003
EventHCI - 2001 - Caen, France
Duration: Sep 1 2002Sep 6 2002

Keywords

  • Electron impact ionization
  • Hemispherical electron monochromator
  • Ionization energy
  • Rare gases
  • Threshold law
  • Wannier exponent

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

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