High resolution multiple electron impact ionisation of He, Ne, Ar, Kr and Xe atoms close to threshold: Appearance energies and Wannier exponents

B. Gstir, S. Denifl, G. Hanel, M. Rümmele, T. Fiegele, M. Stano, L. Feketeova, S. Matejcik, K. Becker, P. Scheier, T. D. Märk

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Chemical Compounds