Identification of selective oxidation of TiC/SiC composite with X-ray diffraction and Raman spectroscopy

Nicoleta Doriana Banu, Ionut Banu, Marios S. Katsiotis, Anjana Tharalekshmy, Samuel Stephen, Jamie Whelan, Gisha Elizabeth Luckachan, Radu Vladea, Saeed M. Alhassan

Research output: Contribution to journalArticlepeer-review

Abstract

Open cell 3D titanium carbide/silicon carbide (TiC/SiC) composite was oxidised to titanium oxide/silicon carbide (TiO2/SiC) following different temperature profiles in a thermal gravimetric analysis (TGA) instrument in continuous air-flow and static air (oven) environments. The TiC oxidation to anatase, starting at temperatures over 450°C, was confirmed by Raman spectroscopy and X-Ray diffraction (XRD). By increasing the temperature, the mass fraction of anatase diminished, while the mass fraction of rutile increased. SiC oxidation started at 650°C when a mixture of TiO2/SiO2/SiC could be observed by Raman, XRD and HRTEM.

Original languageEnglish (US)
Pages (from-to)1503-1511
Number of pages9
JournalChemical Papers
Volume70
Issue number11
DOIs
StatePublished - Nov 1 2016

Keywords

  • Raman spectroscopy
  • TiC/SiC composite
  • X-ray diffraction
  • anatase
  • rutile
  • selective oxidation

ASJC Scopus subject areas

  • General Chemistry
  • Biochemistry
  • General Chemical Engineering
  • Industrial and Manufacturing Engineering
  • Materials Chemistry

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