Image denoising employing a mixture of circular symmetric Laplacian models with local parameters in complex wavelet domain

Hossein Rabbani, Mansur Vafadust, Ivan Selesnick, Saeed Gazor

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, We present a new image denoising algorithm. We assume a mixture of bivariate circular symmetric Laplacian probability density functions (pdfs) where for each wavelet coefficients may have different local parameter. This pdf characterizes simultaneously 1) the heavy-tailed nature, 2) the interscale dependencies of the wavelet coefficients and also 3) the empirically observed correlation between the coefficient amplitudes. We employ this local bivariate mixture model to derive a Bayesian image denoising technique. This proposed pdf, potentially can fits better the statistical properties of the wavelet coefficients than several other existing models. Our simulation results reveal that the proposed denoising method is among the best reported in the literature. This is justified since the accuracy of the employed distribution for noise-free data determines the denoising performance.

Original languageEnglish (US)
Title of host publication2007 IEEE International Conference on Acoustics, Speech and Signal Processing, ICASSP '07
PagesI805-I808
DOIs
StatePublished - 2007
Event2007 IEEE International Conference on Acoustics, Speech and Signal Processing, ICASSP '07 - Honolulu, HI, United States
Duration: Apr 15 2007Apr 20 2007

Publication series

NameICASSP, IEEE International Conference on Acoustics, Speech and Signal Processing - Proceedings
Volume1
ISSN (Print)1520-6149

Other

Other2007 IEEE International Conference on Acoustics, Speech and Signal Processing, ICASSP '07
Country/TerritoryUnited States
CityHonolulu, HI
Period4/15/074/20/07

Keywords

  • Circular symmetric Laplacian pdf
  • Complex wavelet transforms
  • MAP estimator
  • Mixture model

ASJC Scopus subject areas

  • Software
  • Signal Processing
  • Electrical and Electronic Engineering

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