Abstract
A ring oscillator circuit was used to show that many gate oxide breakdowns could occur in parts of a digital circuit without affecting its overall logical function. This observation implied that the present reliability specifications were too stringent if maintaining the circuit's logical function was the sufficient reliability criteria.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 553-556 |
| Number of pages | 4 |
| Journal | Technical Digest - International Electron Devices Meeting |
| State | Published - 2000 |
| Event | 2000 IEEE International Electron Devices Meeting - San Francisco, CA, United States Duration: Dec 10 2000 → Dec 13 2000 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering
- Materials Chemistry