Improving inventory round times in EPC gen2 RFID by utilizing doubly collided slots

Benjamin Bekritsky, Peter Voltz

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publicationInternational Conference on Cutting Edge Wireless and IT Technologies (CEWIT'07), Stony Brook, NY, January 18, 2007
StatePublished - 2007

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