Original language | English (US) |
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Title of host publication | International Conference on Cutting Edge Wireless and IT Technologies (CEWIT'07), Stony Brook, NY, January 18, 2007 |
State | Published - 2007 |
Improving inventory round times in EPC gen2 RFID by utilizing doubly collided slots
Benjamin Bekritsky, Peter Voltz
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution