Improving the effectiveness of XOR-based decompressors through horizontal/vertical move of stimulus fragments

Nader Alawadhi, Ozgur Sinanoglu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

While test stimulus compression helps reduce test time and data volume, and thus alleviates test costs, the delivery of certain test vectors may not be possible, leading to test quality degradation. Whether a test vector is encodable in the presence of a decompressor strongly hinges on the distribution of its care bits. Utilization of stimulus manipulation techniques improves test pattern encodability as the distribution of care bits can be judiciously controlled. The desired test vector is delivered by resolving the stimulus conflicts that would have otherwise lead to pattern unencodability. Stimulus manipulation in the form of horizontal move of stimulus fragments has been shown to improve fan-out decompressors. In this work, we propose manipulation techniques in the form of horizontal or vertical move of stimulus fragments in order to improve XOR-based decompressors. Improvement in test pattern encodability reflects into savings in test costs and/or increase in test quality. The hardware and algorithmic support for each solution are also elaborated on, demonstrating the practicality of the proposed manipulation techniques.

Original languageEnglish (US)
Title of host publication2009 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009
Pages295-303
Number of pages9
DOIs
StatePublished - 2009
Event2009 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009 - Chicago, IL, United States
Duration: Oct 7 2009Oct 9 2009

Publication series

NameProceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
ISSN (Print)1550-5774

Other

Other2009 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009
CountryUnited States
CityChicago, IL
Period10/7/0910/9/09

ASJC Scopus subject areas

  • Engineering(all)

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