TY - GEN
T1 - Improving the effectiveness of XOR-based decompressors through horizontal/vertical move of stimulus fragments
AU - Alawadhi, Nader
AU - Sinanoglu, Ozgur
PY - 2009
Y1 - 2009
N2 - While test stimulus compression helps reduce test time and data volume, and thus alleviates test costs, the delivery of certain test vectors may not be possible, leading to test quality degradation. Whether a test vector is encodable in the presence of a decompressor strongly hinges on the distribution of its care bits. Utilization of stimulus manipulation techniques improves test pattern encodability as the distribution of care bits can be judiciously controlled. The desired test vector is delivered by resolving the stimulus conflicts that would have otherwise lead to pattern unencodability. Stimulus manipulation in the form of horizontal move of stimulus fragments has been shown to improve fan-out decompressors. In this work, we propose manipulation techniques in the form of horizontal or vertical move of stimulus fragments in order to improve XOR-based decompressors. Improvement in test pattern encodability reflects into savings in test costs and/or increase in test quality. The hardware and algorithmic support for each solution are also elaborated on, demonstrating the practicality of the proposed manipulation techniques.
AB - While test stimulus compression helps reduce test time and data volume, and thus alleviates test costs, the delivery of certain test vectors may not be possible, leading to test quality degradation. Whether a test vector is encodable in the presence of a decompressor strongly hinges on the distribution of its care bits. Utilization of stimulus manipulation techniques improves test pattern encodability as the distribution of care bits can be judiciously controlled. The desired test vector is delivered by resolving the stimulus conflicts that would have otherwise lead to pattern unencodability. Stimulus manipulation in the form of horizontal move of stimulus fragments has been shown to improve fan-out decompressors. In this work, we propose manipulation techniques in the form of horizontal or vertical move of stimulus fragments in order to improve XOR-based decompressors. Improvement in test pattern encodability reflects into savings in test costs and/or increase in test quality. The hardware and algorithmic support for each solution are also elaborated on, demonstrating the practicality of the proposed manipulation techniques.
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U2 - 10.1109/DFT.2009.9
DO - 10.1109/DFT.2009.9
M3 - Conference contribution
AN - SCOPUS:77649287423
SN - 9780769538396
T3 - Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
SP - 295
EP - 303
BT - 2009 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009
T2 - 2009 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009
Y2 - 7 October 2009 through 9 October 2009
ER -