Innovation Practices Track: Security in Test and Test for Security

Keyphrases

• Physical Unclonable Function 100%
• Security Vulnerabilities 100%
• Innovation Practices 100%
• Recent Advances 50%
• Design Approach 50%
• Chip Design 50%
• Scan Chain 50%
• Machine Learning 50%
• Hardware Security 50%
• Scan Design 50%
• Error Correction 50%
• Security Countermeasures 50%
• VLSI Testing 50%
• Adaptive Framework 50%
• Partial Scan 50%
• Early Design Phases 50%
• Function Design 50%

Computer Science

• Early Design Stage 50%