Instruction-level impact analysis of low-level faults in a modern microprocessor controller

Michail Maniatakos, Naghmeh Karimi, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris

Research output: Contribution to journalArticle

Abstract

We investigate the correlation between low-level faults in the control logic of a modern microprocessor and their instruction-level impact on the execution of typical workload. Such information can prove immensely useful in accurately assessing and prioritizing faults with regards to their criticality, as well as commensurately allocating resources to enhance online testability and error/fault resilience through concurrent error detection/correction methods. To this end, we developed an extensive fault simulation infrastructure which allows injection of stuck-at faults and transient errors of arbitrary starting time and duration, as well as cost-effective simulation and classification of their repercussions into various instruction-level error types. As a test vehicle for our study, we employ a superscalar, dynamically-scheduled, out-of-order, Alpha-like microprocessor, on which we execute SPEC2000 integer benchmarks. Extensive fault injection campaigns in control modules of this microprocessor facilitate valuable observations regarding the distribution of low-level faults into the instruction-level error types that they cause. Experimentation with both Register Transfer (RT-) and Gate-Level faults, as well as with both stuck-at faults and transient errors, confirms the validity and corroborates the utility of these observations.

Original languageEnglish (US)
Article number5432157
Pages (from-to)1260-1273
Number of pages14
JournalIEEE Transactions on Computers
Volume60
Issue number9
DOIs
StatePublished - 2011

Keywords

  • Fault simulation
  • concurrent error detection
  • instruction-level error
  • microprocessor controller

ASJC Scopus subject areas

  • Software
  • Theoretical Computer Science
  • Hardware and Architecture
  • Computational Theory and Mathematics

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