TY - GEN
T1 - Interconnect performance and energy-per-bit for post-CMOS logic circuits
T2 - 2011 IEEE International Interconnect Technology Conference and 2011 Materials for Advanced Metallization, IITC/MAM 2011
AU - Rakheja, Shaloo
AU - Naeemi, Azad
PY - 2011
Y1 - 2011
N2 - To overcome the energy dissipation limit facing virtually all field-effect devices including CMOS switches, there is a global search for devices using alternate state variables as the token of information. In this paper, physical models for latency and energy dissipation associated with various transport mechanisms are reviewed. Using stochastic wire length distribution models based on Rent's rule, the dependence of the average interconnect delay and energy dissipation on the number of gates in a circuit is obtained for alternative post-CMOS logic circuits. Further, it is demonstrated that the required number of repeaters increases rapidly with the circuit size if the token of information decays as it propagates (e.g. spin relaxation for electron spin). This puts an upper bound on the circuit size. For a spin relaxation length of L s=2μm, the maximum circuit size for random logic is limited to 40 gates if less than 10% of the switches are to be used as interconnect repeaters and if the signal amplitude at the driver is twice the receiver's threshold. This maximum circuit size increases to 2000 gates if the spin relaxation length is increased to 8m at the same signal amplitude.
AB - To overcome the energy dissipation limit facing virtually all field-effect devices including CMOS switches, there is a global search for devices using alternate state variables as the token of information. In this paper, physical models for latency and energy dissipation associated with various transport mechanisms are reviewed. Using stochastic wire length distribution models based on Rent's rule, the dependence of the average interconnect delay and energy dissipation on the number of gates in a circuit is obtained for alternative post-CMOS logic circuits. Further, it is demonstrated that the required number of repeaters increases rapidly with the circuit size if the token of information decays as it propagates (e.g. spin relaxation for electron spin). This puts an upper bound on the circuit size. For a spin relaxation length of L s=2μm, the maximum circuit size for random logic is limited to 40 gates if less than 10% of the switches are to be used as interconnect repeaters and if the signal amplitude at the driver is twice the receiver's threshold. This maximum circuit size increases to 2000 gates if the spin relaxation length is increased to 8m at the same signal amplitude.
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U2 - 10.1109/IITC.2011.5940267
DO - 10.1109/IITC.2011.5940267
M3 - Conference contribution
AN - SCOPUS:80052062333
SN - 9781457705038
T3 - 2011 IEEE International Interconnect Technology Conference and 2011 Materials for Advanced Metallization, IITC/MAM 2011
BT - 2011 IEEE International Interconnect Technology Conference and 2011 Materials for Advanced Metallization, IITC/MAM 2011
Y2 - 8 May 2011 through 12 May 2011
ER -