Original language | English (US) |
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Title of host publication | Semiconductor Research Corporation (SRC), TECHCON. Austin, Texas, September 13-14, 2012 |
State | Published - 2012 |
Interconnects for novel state variables: Modeling physical limits and comparison with CMOS
Shaloo Rakheja, Azad Naeemi
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution