Interconnects for novel state variables: Modeling physical limits and comparison with CMOS

Shaloo Rakheja, Azad Naeemi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publicationSemiconductor Research Corporation (SRC), TECHCON. Austin, Texas, September 13-14, 2012
StatePublished - 2012

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