Iris recognition using scattering transform and textural features

Shervin Minaee, Amirali Abdolrashidi, Yao Wang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Iris recognition has drawn a lot of attention since the mid-twentieth century. Among all biometric features, iris is known to possess a rich set of features. Different features have been used to perform iris recognition in the past. In this paper, two powerful sets of features are introduced to be used for iris recognition: scattering transform-based features and textural features. PCA is also applied on the extracted features to reduce the dimensionality of the feature vector while preserving most of the information of its initial value. Minimum distance classifier is used to perform template matching for each new test sample. The proposed scheme is tested on a well-known iris database, and showed promising results with the best accuracy rate of 99.2%.

Original languageEnglish (US)
Title of host publication2015 IEEE Signal Processing and Signal Processing Education Workshop, SP/SPE 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages37-42
Number of pages6
ISBN (Electronic)9781467391696
DOIs
StatePublished - Dec 30 2015
EventIEEE Signal Processing and Signal Processing Education Workshop, SP/SPE 2015 - Salt Lake City, United States
Duration: Aug 9 2015Aug 12 2015

Publication series

Name2015 IEEE Signal Processing and Signal Processing Education Workshop, SP/SPE 2015

Other

OtherIEEE Signal Processing and Signal Processing Education Workshop, SP/SPE 2015
CountryUnited States
CitySalt Lake City
Period8/9/158/12/15

ASJC Scopus subject areas

  • Signal Processing
  • Education

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  • Cite this

    Minaee, S., Abdolrashidi, A., & Wang, Y. (2015). Iris recognition using scattering transform and textural features. In 2015 IEEE Signal Processing and Signal Processing Education Workshop, SP/SPE 2015 (pp. 37-42). [7369524] (2015 IEEE Signal Processing and Signal Processing Education Workshop, SP/SPE 2015). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/DSP-SPE.2015.7369524