TY - GEN
T1 - Iris recognition using scattering transform and textural features
AU - Minaee, Shervin
AU - Abdolrashidi, Amirali
AU - Wang, Yao
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/12/30
Y1 - 2015/12/30
N2 - Iris recognition has drawn a lot of attention since the mid-twentieth century. Among all biometric features, iris is known to possess a rich set of features. Different features have been used to perform iris recognition in the past. In this paper, two powerful sets of features are introduced to be used for iris recognition: scattering transform-based features and textural features. PCA is also applied on the extracted features to reduce the dimensionality of the feature vector while preserving most of the information of its initial value. Minimum distance classifier is used to perform template matching for each new test sample. The proposed scheme is tested on a well-known iris database, and showed promising results with the best accuracy rate of 99.2%.
AB - Iris recognition has drawn a lot of attention since the mid-twentieth century. Among all biometric features, iris is known to possess a rich set of features. Different features have been used to perform iris recognition in the past. In this paper, two powerful sets of features are introduced to be used for iris recognition: scattering transform-based features and textural features. PCA is also applied on the extracted features to reduce the dimensionality of the feature vector while preserving most of the information of its initial value. Minimum distance classifier is used to perform template matching for each new test sample. The proposed scheme is tested on a well-known iris database, and showed promising results with the best accuracy rate of 99.2%.
UR - http://www.scopus.com/inward/record.url?scp=84964039372&partnerID=8YFLogxK
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U2 - 10.1109/DSP-SPE.2015.7369524
DO - 10.1109/DSP-SPE.2015.7369524
M3 - Conference contribution
AN - SCOPUS:84964039372
T3 - 2015 IEEE Signal Processing and Signal Processing Education Workshop, SP/SPE 2015
SP - 37
EP - 42
BT - 2015 IEEE Signal Processing and Signal Processing Education Workshop, SP/SPE 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - IEEE Signal Processing and Signal Processing Education Workshop, SP/SPE 2015
Y2 - 9 August 2015 through 12 August 2015
ER -