Issues in developing a parametrized VHDL library for on-line testing

Ramesh Karri, C. Stroud, M Ding

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publicationProceedings of Lucent Conference on Electronic Testing. April 1998. Princeton, NJ
Pages479-488
StatePublished - 1998

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