TY - GEN
T1 - JTAG
T2 - 25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019
AU - Rajput, Prashant Hari Narayan
AU - Maniatakos, Michail
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019/7
Y1 - 2019/7
N2 - JTAG is an IEEE standard for testing and debugging electronic circuits. In general, this standard allows serial test instructions and test data to be passed through the input ports. After execution of test instructions, the corresponding serial output can be shifted out. Due to this powerful low level hardware access, JTAG has been explored in literature for performing cyber attacks on devices. On the other hand, its potential has also been realized to defend against attacks at the lowest level. In this paper, we explore JTAG as a tool on both ends of the spectrum.
AB - JTAG is an IEEE standard for testing and debugging electronic circuits. In general, this standard allows serial test instructions and test data to be passed through the input ports. After execution of test instructions, the corresponding serial output can be shifted out. Due to this powerful low level hardware access, JTAG has been explored in literature for performing cyber attacks on devices. On the other hand, its potential has also been realized to defend against attacks at the lowest level. In this paper, we explore JTAG as a tool on both ends of the spectrum.
KW - IEEE 1149
KW - JTAG
KW - cyber attack
KW - defense
KW - survey
UR - http://www.scopus.com/inward/record.url?scp=85073744087&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85073744087&partnerID=8YFLogxK
U2 - 10.1109/IOLTS.2019.8854430
DO - 10.1109/IOLTS.2019.8854430
M3 - Conference contribution
T3 - 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019
SP - 155
EP - 158
BT - 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019
A2 - Gizopoulos, Dimitris
A2 - Alexandrescu, Dan
A2 - Papavramidou, Panagiota
A2 - Maniatakos, Michail
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 1 July 2019 through 3 July 2019
ER -