JTAG: A Multifaceted Tool for Cyber Security

Prashant Hari Narayan Rajput, Michail Maniatakos

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

JTAG is an IEEE standard for testing and debugging electronic circuits. In general, this standard allows serial test instructions and test data to be passed through the input ports. After execution of test instructions, the corresponding serial output can be shifted out. Due to this powerful low level hardware access, JTAG has been explored in literature for performing cyber attacks on devices. On the other hand, its potential has also been realized to defend against attacks at the lowest level. In this paper, we explore JTAG as a tool on both ends of the spectrum.

Original languageEnglish (US)
Title of host publication2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019
EditorsDimitris Gizopoulos, Dan Alexandrescu, Panagiota Papavramidou, Michail Maniatakos
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages155-158
Number of pages4
ISBN (Electronic)9781728124902
DOIs
StatePublished - Jul 2019
Event25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019 - Rhodes, Greece
Duration: Jul 1 2019Jul 3 2019

Publication series

Name2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019

Conference

Conference25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019
CountryGreece
CityRhodes
Period7/1/197/3/19

Keywords

  • IEEE 1149
  • JTAG
  • cyber attack
  • defense
  • survey

ASJC Scopus subject areas

  • Artificial Intelligence
  • Computer Networks and Communications
  • Hardware and Architecture
  • Safety, Risk, Reliability and Quality

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  • Cite this

    Rajput, P. H. N., & Maniatakos, M. (2019). JTAG: A Multifaceted Tool for Cyber Security. In D. Gizopoulos, D. Alexandrescu, P. Papavramidou, & M. Maniatakos (Eds.), 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019 (pp. 155-158). [8854430] (2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IOLTS.2019.8854430