Junctions: detection, classification, and reconstruction

Laxmi Parida, Davi Geiger, Robert Hummel

Research output: Contribution to journalArticlepeer-review

Abstract

Junctions are important features for image analysis and form a critical aspect of image understanding tasks such as object recognition. We present a unified approach to detecting (location of the center of the junction), classifying (by the number of wedges-lines, corners, three-junctions such as T or Y junctions, or four-junctions such as X-junctions), and reconstructing junctions (in terms of radius size, the angles of each wedge and the intensity in each of the wedges) in images. Our main contribution is a modeling of the junction which is complex enough to handle all these issues and yet simple enough to admit an effective dynamic programming solution. Broadly, we use a template deformation framework along with a gradient criterium to detect radial partitions of the template. We use the minimum description length principle to obtain the optimal number of partitions that best describes the junction. Kona [27] is an implementation of this model. We (quantitatively) demonstrate the stability and robustness of the detector by analyzing its behavior in the presence of noise, using synthetic/controlled apparatus. We also present a qualitative study of its behavior on real images.

Original languageEnglish (US)
Pages (from-to)687-698
Number of pages12
JournalIEEE Transactions on Pattern Analysis and Machine Intelligence
Volume20
Issue number7
DOIs
StatePublished - 1998

Keywords

  • Corners
  • Energy minimization. © 1998 ieee
  • Feature detection
  • Junctions
  • Low-level vision
  • Minimum description length (MDL) principle

ASJC Scopus subject areas

  • Software
  • Computer Vision and Pattern Recognition
  • Computational Theory and Mathematics
  • Artificial Intelligence
  • Applied Mathematics

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