Abstract
Broadside-coupled microstrip with and without conducting side walls are studied using a full-wave spectral-domain analysis. Special attention is directed towards possible leakage to the parallel plate mode and its potential effects in practical integrated circuits. It is asserted that for appropriate geometrical parameters, broadside-coupled microstrip can be leaky at all frequencies. Instructive comparisons between the modes on broadside-coupled microstrip with and without side walls are made by means of dispersion curves and field plots. From the comparison, approaches for reducing the low-frequency leakage are proposed.
Original language | English (US) |
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Pages (from-to) | 58-66 |
Number of pages | 9 |
Journal | IEEE Transactions on Microwave Theory and Techniques |
Volume | 40 |
Issue number | 1 |
DOIs | |
State | Published - Jan 1992 |
ASJC Scopus subject areas
- Radiation
- Condensed Matter Physics
- Electrical and Electronic Engineering