TY - JOUR
T1 - Logic locking with provable security against power analysis attacks
AU - Sengupta, Abhrajit
AU - Mazumdar, Bodhisatwa
AU - Yasin, Muhammad
AU - Sinanoglu, Ozgur
N1 - Funding Information:
Manuscript received July 9, 2018; revised September 16, 2018 and November 24, 2018; accepted December 2, 2018. Date of publication February 4, 2019; date of current version March 18, 2020. This work was supported in part by the Defense Advanced Research Projects Agency (DARPA) OMG Program and in part by the New York University/New York University Abu Dhabi (NYU/ NYUAD) Center for Cyber Security (CCS). A preliminary version of this paper was presented at IEEE DFTS 2015 [1]. This paper was recommended by Associate Editor Y. Jin. (Corresponding author: Bodhisatwa Mazumdar.) A. Sengupta and M. Yasin are with the Department of Electrical and Computer Engineering, Tandon School of Engineering, New York University, Brooklyn, NY 11201 USA (e-mail: [email protected]; [email protected]).
Publisher Copyright:
© 1982-2012 IEEE.
PY - 2020/4
Y1 - 2020/4
N2 - Outsourcing of integrated circuit (IC) fabrication to external foundries has lead to many new security vulnerabilities, including IC piracy, overbuilding, and reverse engineering. In this regard, logic locking (LL) was introduced to protect intellectual property from such threats. In this paper, we evaluate the strength of various LL techniques, including earlier works, such as random LL (RLL) and fault analysis-based LL (FLL), against power-based side-channel attack. We have developed attacks where at least 60% of the key bits can be successfully recovered for 60% of the circuits for both RLL and FLL using a 32-bit key. However, the success rate reduces to 45% and 35% for RLL and FLL, respectively, when using a 64-bit key. We demonstrate the practicality of our proposed attack by mounting it against RLL and FLL implementations of ISCAS'85 and MCNC benchmark circuits on Spartan-6 FPGA platform. Further, we present differential power analysis (DPA) results on mutual information analysis on LL techniques that capture any dependence between the intermediate data and the captured power traces. We also formally establish that resilience to satisfiability-based (SAT) attack implies resilience to DPA attack as well for an LL technique. We validate this further via experiments on Spartan-6 FPGA on SAKURA-G development board for a recent LL technique that is known to thwart the SAT attack.
AB - Outsourcing of integrated circuit (IC) fabrication to external foundries has lead to many new security vulnerabilities, including IC piracy, overbuilding, and reverse engineering. In this regard, logic locking (LL) was introduced to protect intellectual property from such threats. In this paper, we evaluate the strength of various LL techniques, including earlier works, such as random LL (RLL) and fault analysis-based LL (FLL), against power-based side-channel attack. We have developed attacks where at least 60% of the key bits can be successfully recovered for 60% of the circuits for both RLL and FLL using a 32-bit key. However, the success rate reduces to 45% and 35% for RLL and FLL, respectively, when using a 64-bit key. We demonstrate the practicality of our proposed attack by mounting it against RLL and FLL implementations of ISCAS'85 and MCNC benchmark circuits on Spartan-6 FPGA platform. Further, we present differential power analysis (DPA) results on mutual information analysis on LL techniques that capture any dependence between the intermediate data and the captured power traces. We also formally establish that resilience to satisfiability-based (SAT) attack implies resilience to DPA attack as well for an LL technique. We validate this further via experiments on Spartan-6 FPGA on SAKURA-G development board for a recent LL technique that is known to thwart the SAT attack.
KW - Boolean satisfiability (SAT)
KW - differential power attack
KW - hardware security
KW - logic locking (LL)
KW - side-channel attack
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U2 - 10.1109/TCAD.2019.2897699
DO - 10.1109/TCAD.2019.2897699
M3 - Article
AN - SCOPUS:85082401927
SN - 0278-0070
VL - 39
SP - 766
EP - 778
JO - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
JF - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IS - 4
M1 - 8634868
ER -