Longitudinal and transverse magnetization components in thin films: A resonant magnetic reflectivity investigation using circularly polarized soft x-rays

J. S. Lee; E. Vescovo; D. A. Arena; C. C. Kao; J. M. Beaujour; A. D. Kent; H. Jang; J. H. Park; J. Y. Kim

doi:10.1063/1.3292207

Longitudinal and transverse magnetization components in thin films: A resonant magnetic reflectivity investigation using circularly polarized soft x-rays

J. S. Lee, E. Vescovo, D. A. Arena, C. C. Kao, J. M. Beaujour, A. D. Kent, H. Jang, J. H. Park, J. Y. Kim

Research output: Contribution to journal › Article › peer-review

Abstract

An in-plane vectorial analysis of the magnetization of thin magnetic films is presented. Longitudinal soft x-ray resonant magnetic reflectivity curves display characteristic nodes where the longitudinal scattering component is suppressed by x-ray interference. The transverse magnetic component can be effectively retrieved at these nodal points, despite the use of circular polarization and longitudinal scattering geometry. Using a single geometric configuration, transverse and longitudinal magnetic hysteresis loops can be clearly separated. Calculations based on a Stoner-Wohlfarth model satisfactorily describe both loops. Therefore, this method presents a viable alternative to standard vectorial analysis techniques, with the additional benefit of element specificity.

Original language	English (US)
Article number	042507
Journal	Applied Physics Letters
Volume	96
Issue number	4
DOIs	https://doi.org/10.1063/1.3292207
State	Published - 2010

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.3292207

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@article{18af5eb521464d669fc7d57403db276c,

title = "Longitudinal and transverse magnetization components in thin films: A resonant magnetic reflectivity investigation using circularly polarized soft x-rays",

abstract = "An in-plane vectorial analysis of the magnetization of thin magnetic films is presented. Longitudinal soft x-ray resonant magnetic reflectivity curves display characteristic nodes where the longitudinal scattering component is suppressed by x-ray interference. The transverse magnetic component can be effectively retrieved at these nodal points, despite the use of circular polarization and longitudinal scattering geometry. Using a single geometric configuration, transverse and longitudinal magnetic hysteresis loops can be clearly separated. Calculations based on a Stoner-Wohlfarth model satisfactorily describe both loops. Therefore, this method presents a viable alternative to standard vectorial analysis techniques, with the additional benefit of element specificity.",

author = "Lee, {J. S.} and E. Vescovo and Arena, {D. A.} and Kao, {C. C.} and Beaujour, {J. M.} and Kent, {A. D.} and H. Jang and Park, {J. H.} and Kim, {J. Y.}",

note = "Funding Information: We gratefully acknowledge Dr. E. Negusse for technical assistance. NSLS, Brookhaven National Laboratory, is supported by the U.S. DOE, Office of Science, Office of Basic Energy Sciences, under Grant No. DE-AC02-98CH10886. NYU is supported by National Science Foundation under Grant No. NSF-DMR-0706322. POSTECH is supported by KRF under Grant No. KRF-2006-312-C00523 and by WCU through KOSEF under Grant No. R31-2008-000-10059-0. PAL is supported by POSTECH and MOST. ",

year = "2010",

doi = "10.1063/1.3292207",

language = "English (US)",

volume = "96",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

number = "4",

}

TY - JOUR

T1 - Longitudinal and transverse magnetization components in thin films

T2 - A resonant magnetic reflectivity investigation using circularly polarized soft x-rays

AU - Lee, J. S.

AU - Vescovo, E.

AU - Arena, D. A.

AU - Kao, C. C.

AU - Beaujour, J. M.

AU - Kent, A. D.

AU - Jang, H.

AU - Park, J. H.

AU - Kim, J. Y.

N1 - Funding Information: We gratefully acknowledge Dr. E. Negusse for technical assistance. NSLS, Brookhaven National Laboratory, is supported by the U.S. DOE, Office of Science, Office of Basic Energy Sciences, under Grant No. DE-AC02-98CH10886. NYU is supported by National Science Foundation under Grant No. NSF-DMR-0706322. POSTECH is supported by KRF under Grant No. KRF-2006-312-C00523 and by WCU through KOSEF under Grant No. R31-2008-000-10059-0. PAL is supported by POSTECH and MOST.

PY - 2010

Y1 - 2010

N2 - An in-plane vectorial analysis of the magnetization of thin magnetic films is presented. Longitudinal soft x-ray resonant magnetic reflectivity curves display characteristic nodes where the longitudinal scattering component is suppressed by x-ray interference. The transverse magnetic component can be effectively retrieved at these nodal points, despite the use of circular polarization and longitudinal scattering geometry. Using a single geometric configuration, transverse and longitudinal magnetic hysteresis loops can be clearly separated. Calculations based on a Stoner-Wohlfarth model satisfactorily describe both loops. Therefore, this method presents a viable alternative to standard vectorial analysis techniques, with the additional benefit of element specificity.

AB - An in-plane vectorial analysis of the magnetization of thin magnetic films is presented. Longitudinal soft x-ray resonant magnetic reflectivity curves display characteristic nodes where the longitudinal scattering component is suppressed by x-ray interference. The transverse magnetic component can be effectively retrieved at these nodal points, despite the use of circular polarization and longitudinal scattering geometry. Using a single geometric configuration, transverse and longitudinal magnetic hysteresis loops can be clearly separated. Calculations based on a Stoner-Wohlfarth model satisfactorily describe both loops. Therefore, this method presents a viable alternative to standard vectorial analysis techniques, with the additional benefit of element specificity.

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U2 - 10.1063/1.3292207

DO - 10.1063/1.3292207

M3 - Article

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SN - 0003-6951

VL - 96

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 4

M1 - 042507

ER -

Longitudinal and transverse magnetization components in thin films: A resonant magnetic reflectivity investigation using circularly polarized soft x-rays

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