Longitudinal and transverse magnetization components in thin films: A resonant magnetic reflectivity investigation using circularly polarized soft x-rays

J. S. Lee, E. Vescovo, D. A. Arena, C. C. Kao, J. M. Beaujour, A. D. Kent, H. Jang, J. H. Park, J. Y. Kim

    Research output: Contribution to journalArticle

    Abstract

    An in-plane vectorial analysis of the magnetization of thin magnetic films is presented. Longitudinal soft x-ray resonant magnetic reflectivity curves display characteristic nodes where the longitudinal scattering component is suppressed by x-ray interference. The transverse magnetic component can be effectively retrieved at these nodal points, despite the use of circular polarization and longitudinal scattering geometry. Using a single geometric configuration, transverse and longitudinal magnetic hysteresis loops can be clearly separated. Calculations based on a Stoner-Wohlfarth model satisfactorily describe both loops. Therefore, this method presents a viable alternative to standard vectorial analysis techniques, with the additional benefit of element specificity.

    Original languageEnglish (US)
    Article number042507
    JournalApplied Physics Letters
    Volume96
    Issue number4
    DOIs
    StatePublished - 2010

    ASJC Scopus subject areas

    • Physics and Astronomy (miscellaneous)

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    Lee, J. S., Vescovo, E., Arena, D. A., Kao, C. C., Beaujour, J. M., Kent, A. D., Jang, H., Park, J. H., & Kim, J. Y. (2010). Longitudinal and transverse magnetization components in thin films: A resonant magnetic reflectivity investigation using circularly polarized soft x-rays. Applied Physics Letters, 96(4), [042507]. https://doi.org/10.1063/1.3292207