Magnetic coupling in FeSm/FeTaN multilayer thin films was studied using magnetization and ferromagnetic resonance (FMR) techniques. Reversal of the soft and hard magnetic layers depended strongly on the thickness of each individual layer. The observed behavior was modeled with a free energy that included an easy axis anisotropy and exchange interaction between both magnetic layers.
|Original language||English (US)|
|Journal||Digests of the Intermag Conference|
|State||Published - 2002|
|Event||2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands|
Duration: Apr 28 2002 → May 2 2002
ASJC Scopus subject areas
- Electrical and Electronic Engineering