Magnetic properties of fe microstructures with focused ion beam-fabricated nano-constrictions

Igor V. Roshchin, Jun Yu, Andrew D. Kent, Gary W. Stupian, Martin S. Leung

    Research output: Contribution to journalConference articlepeer-review

    Abstract

    Studies of the magnetic properties of Fe microfabricated wires with a mechanically stable 40 to 120 nm-wide constriction produced with focused ion beam are reported. The 2 to 20 μm-wide wires are fabricated by photolithography from 3 nm and 25 nm-thick epitaxial (110) bcc Fe films. This fabrication method appears to preserve the magnetic properties of the constriction. The structures are studied by MFM and by magneto-optic Kerr effect (MOKE) measurements. The ratio of the wire linewidth to its thickness determines the demagnetization factor and, therefore, influences the coercivity of the wire. Both a step in the width of the wire and a nano-constriction in the middle of the wire are found to be domain wall (DW) pinning centers.

    Original languageEnglish (US)
    Pages (from-to)2101-2103
    Number of pages3
    JournalIEEE Transactions on Magnetics
    Volume37
    Issue number4 I
    DOIs
    StatePublished - Jul 2001
    Event8th Joint Magnetism and Magnetic Materials -International Magnetic Conference- (MMM-Intermag) - San Antonio, TX, United States
    Duration: Jan 7 2001Jan 11 2001

    Keywords

    • FIB
    • Fe
    • Ferromagnetic microstructures
    • Iron epitaxial thin films
    • Kerr effect
    • MFM
    • Magnetization reversal
    • Nano-structures

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Electrical and Electronic Engineering

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