Magnetoresistance of thin palladium films

W. C. McGinnis, M. J. Burns, R. W. Simon, G. Deutscher, P. M. Chaikin

    Research output: Contribution to journalArticlepeer-review


    We have measured the temperature and magnetic field dependence of the resistivity of palladium films of ∼ 25 Å thickness. We find a logarithmic temperature increase with decreasing temperature and a large, positive, isotropic, temperature dependent magnetoresistance. Similar results with PdAu films show that the effect is not magnetic in origin. The temperature coefficient and positive magnetoresistance are consistent with an interpretation in terms of the interaction picture rather than localization effects.

    Original languageEnglish (US)
    Pages (from-to)5-6
    Number of pages2
    JournalPhysica B+C
    Issue number1-3
    StatePublished - 1981

    ASJC Scopus subject areas

    • General Engineering


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