Malleable NoC: Dark silicon inspired adaptable Network-on-Chip

Haseeb Bokhari, Haris Javaid, Muhammad Shafique, Jorg Henkel, Sri Parameswaran

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Network on Chip (NoC) has been envisioned as a scalable fabric for many core chips. However, NoCs can consume a considerable share of chip power. Moreover, diverse applications are executed in these multicore, where each application imposes a unique load on the NoC. To realise a NoC which is Energy and Delay efficient, we propose combining multiple VF optimized routers for each node (in traditional NoCs, we have only a single router per node) for efficient NoC for Dark Silicon chips. We present a generic NoC with routers designed for different VF levels, which are distributed across the chip. At runtime, depending on application profile, we combine these VF optimized routers to form constantly changing energy efficient NoC fabric. We call our architecture Malleable NoC. In this paper, we describe the architectural details of the proposed architecture and the runtime algorithms required to dynamically adapt the NoC resources. We show that for a variety of multi program benchmarks executing on Malleable NoC, Energy Delay product (EDP) can be reduced by up to 46% for widely differing workloads. We further show the effect on EDP savings for differing amounts of dark silicon area budget.

Original languageEnglish (US)
Title of host publicationProceedings of the 2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1245-1248
Number of pages4
ISBN (Electronic)9783981537048
DOIs
StatePublished - Apr 22 2015
Event2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015 - Grenoble, France
Duration: Mar 9 2015Mar 13 2015

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE
Volume2015-April
ISSN (Print)1530-1591

Other

Other2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015
CountryFrance
CityGrenoble
Period3/9/153/13/15

ASJC Scopus subject areas

  • Engineering(all)

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