Measurement of transmission and reflection from a thick anisotropic crystal modeled by a sum of incoherent partial waves

Shane Nichols, Oriol Arteaga, Alexander Martin, Bart Kahr

Research output: Contribution to journalArticle

Abstract

Formulas for modeling ellipsometric measurements of bianisotropic crystals assume perfectly coherent plane wave illumination. As such, the finite coherence of typical spectroscopic ellipsometers renders such formulas invalid for crystals thicker than a few micrometers. Reflection measurements of thick crystalline slabs show depolarization. Researchers have proposed strategies for the full accounting for multiply reflected incoherent waves in anisotropic, arbitrarily oriented crystals [Appl. Opt. 41, 2521 (2002).], but to the best of our knowledge these methods have not been tested by explicit measurements. It is shown that by a summation of multiply reflected incoherent waves, transmission and reflection measurements of thick quartz slabs can be interpreted in terms of the constitutive material parameters.

Original languageEnglish (US)
Pages (from-to)2049-2057
Number of pages9
JournalJournal of the Optical Society of America A: Optics and Image Science, and Vision
Volume32
Issue number11
DOIs
StatePublished - Nov 1 2015

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Computer Vision and Pattern Recognition

Fingerprint Dive into the research topics of 'Measurement of transmission and reflection from a thick anisotropic crystal modeled by a sum of incoherent partial waves'. Together they form a unique fingerprint.

  • Cite this