TY - JOUR
T1 - Measurement of transmission and reflection from a thick anisotropic crystal modeled by a sum of incoherent partial waves
AU - Nichols, Shane
AU - Arteaga, Oriol
AU - Martin, Alexander
AU - Kahr, Bart
N1 - Publisher Copyright:
© 2015 Optical Society of America.
PY - 2015/11/1
Y1 - 2015/11/1
N2 - Formulas for modeling ellipsometric measurements of bianisotropic crystals assume perfectly coherent plane wave illumination. As such, the finite coherence of typical spectroscopic ellipsometers renders such formulas invalid for crystals thicker than a few micrometers. Reflection measurements of thick crystalline slabs show depolarization. Researchers have proposed strategies for the full accounting for multiply reflected incoherent waves in anisotropic, arbitrarily oriented crystals [Appl. Opt. 41, 2521 (2002).], but to the best of our knowledge these methods have not been tested by explicit measurements. It is shown that by a summation of multiply reflected incoherent waves, transmission and reflection measurements of thick quartz slabs can be interpreted in terms of the constitutive material parameters.
AB - Formulas for modeling ellipsometric measurements of bianisotropic crystals assume perfectly coherent plane wave illumination. As such, the finite coherence of typical spectroscopic ellipsometers renders such formulas invalid for crystals thicker than a few micrometers. Reflection measurements of thick crystalline slabs show depolarization. Researchers have proposed strategies for the full accounting for multiply reflected incoherent waves in anisotropic, arbitrarily oriented crystals [Appl. Opt. 41, 2521 (2002).], but to the best of our knowledge these methods have not been tested by explicit measurements. It is shown that by a summation of multiply reflected incoherent waves, transmission and reflection measurements of thick quartz slabs can be interpreted in terms of the constitutive material parameters.
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U2 - 10.1364/JOSAA.32.002049
DO - 10.1364/JOSAA.32.002049
M3 - Article
AN - SCOPUS:84959378551
SN - 1084-7529
VL - 32
SP - 2049
EP - 2057
JO - Journal of the Optical Society of America A: Optics and Image Science, and Vision
JF - Journal of the Optical Society of America A: Optics and Image Science, and Vision
IS - 11
ER -