TY - GEN
T1 - Measuring bidirectional texture reflectance with a kaleidoscope
AU - Han, Jefferson Y.
AU - Perlin, Ken
PY - 2003
Y1 - 2003
N2 - We describe a new technique for measuring the bidirectional texture function (BTF) of a surface that requires no mechanical movement, can measure surfaces in situ under arbitrary lighting conditions, and can be made small, portable and inexpensive. The enabling innovation is the use of a tapered kaleidoscope, which allows a camera to view the same surface sample simultaneously from many directions. Similarly, the surface can be simultaneously illuminated from many directions, using only a single structured light source. We describe the techniques of construction and measurement, and we show experimental results.
AB - We describe a new technique for measuring the bidirectional texture function (BTF) of a surface that requires no mechanical movement, can measure surfaces in situ under arbitrary lighting conditions, and can be made small, portable and inexpensive. The enabling innovation is the use of a tapered kaleidoscope, which allows a camera to view the same surface sample simultaneously from many directions. Similarly, the surface can be simultaneously illuminated from many directions, using only a single structured light source. We describe the techniques of construction and measurement, and we show experimental results.
KW - BRDF
KW - BTF
KW - image-based rendering
KW - realistic image synthesis
KW - reflection models
UR - http://www.scopus.com/inward/record.url?scp=33749252480&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=33749252480&partnerID=8YFLogxK
U2 - 10.1145/1201775.882341
DO - 10.1145/1201775.882341
M3 - Conference contribution
AN - SCOPUS:33749252480
SN - 1581137095
SN - 9781581137095
T3 - ACM SIGGRAPH 2003 Papers, SIGGRAPH '03
SP - 741
EP - 748
BT - ACM SIGGRAPH 2003 Papers, SIGGRAPH '03
T2 - ACM SIGGRAPH 2003 Papers, SIGGRAPH '03
Y2 - 27 July 2003 through 31 July 2003
ER -