TY - GEN
T1 - Memory-based character recognition using a transformation invariant metric
AU - Simard, Patrice Y.
AU - Cun, Yann Le
AU - Denker, John S.
N1 - Publisher Copyright:
© 1994 Institute of Electrical and Electronics Engineers Inc.. All rights reserved.
PY - 1994
Y1 - 1994
N2 - Memory-based classification algorithms such as Radial Basis Functions or K-nearest neighbors often rely on simple distances (Euclidean distance, Hamming distance, etc.), which are rarely meaningful on pattern vectors. More complex, better suited distance measures are often expensive and rather ad-hoc (elastic matching, deformable templates). We propose a new distance measure which (a) can be made locally invariant to any set of transformations of the input and (b) can be computed efficiently. We tested the method on large handwritten character databases provided by the U.S. Post Office and NIST. Using invariances with respect to translation, rotation, scaling, skewing and line thickness, the method outperformed all other systems on a small (less than 10,000 patterns) database and was competitive on our largest (60,000 patterns) database.
AB - Memory-based classification algorithms such as Radial Basis Functions or K-nearest neighbors often rely on simple distances (Euclidean distance, Hamming distance, etc.), which are rarely meaningful on pattern vectors. More complex, better suited distance measures are often expensive and rather ad-hoc (elastic matching, deformable templates). We propose a new distance measure which (a) can be made locally invariant to any set of transformations of the input and (b) can be computed efficiently. We tested the method on large handwritten character databases provided by the U.S. Post Office and NIST. Using invariances with respect to translation, rotation, scaling, skewing and line thickness, the method outperformed all other systems on a small (less than 10,000 patterns) database and was competitive on our largest (60,000 patterns) database.
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M3 - Conference contribution
AN - SCOPUS:33747449197
T3 - Proceedings - International Conference on Pattern Recognition
SP - 262
EP - 267
BT - Proceedings of the 12th IAPR International Conference on Pattern Recognition - Conference B
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 12th IAPR International Conference on Pattern Recognition - Conference B: Pattern Recognition and Neural Networks, ICPR 1994
Y2 - 9 October 1994 through 13 October 1994
ER -