Method to determine the spring constant of atomic force microscope cantilevers

Christopher T. Gibson; Daniel J. Johnson; Christopher Anderson; Chris Abell; Trevor Rayment

doi:10.1063/1.1642750

Method to determine the spring constant of atomic force microscope cantilevers

Christopher T. Gibson, Daniel J. Johnson, Christopher Anderson, Chris Abell, Trevor Rayment

Civil Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

A method to calibrate the spring constant of atomic force microscope cantilevers was described. The method involved a expression which relates the spring constant of any two cantilevers on the same chip. The measurement of the resonant frequency and the plain view surface area of the cantilevers was also required by the method. A limitation of this method was that the spring constant of one cantilever on the chip should be calculated accurately using another technique.

Original language	English (US)
Pages (from-to)	565-567
Number of pages	3
Journal	Review of Scientific Instruments
Volume	75
Issue number	2
DOIs	https://doi.org/10.1063/1.1642750
State	Published - Feb 2004

ASJC Scopus subject areas

Instrumentation

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10.1063/1.1642750

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abstract = "A method to calibrate the spring constant of atomic force microscope cantilevers was described. The method involved a expression which relates the spring constant of any two cantilevers on the same chip. The measurement of the resonant frequency and the plain view surface area of the cantilevers was also required by the method. A limitation of this method was that the spring constant of one cantilever on the chip should be calculated accurately using another technique.",

author = "Gibson, {Christopher T.} and Johnson, {Daniel J.} and Christopher Anderson and Chris Abell and Trevor Rayment",

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N2 - A method to calibrate the spring constant of atomic force microscope cantilevers was described. The method involved a expression which relates the spring constant of any two cantilevers on the same chip. The measurement of the resonant frequency and the plain view surface area of the cantilevers was also required by the method. A limitation of this method was that the spring constant of one cantilever on the chip should be calculated accurately using another technique.

AB - A method to calibrate the spring constant of atomic force microscope cantilevers was described. The method involved a expression which relates the spring constant of any two cantilevers on the same chip. The measurement of the resonant frequency and the plain view surface area of the cantilevers was also required by the method. A limitation of this method was that the spring constant of one cantilever on the chip should be calculated accurately using another technique.

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Method to determine the spring constant of atomic force microscope cantilevers

Abstract

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