A method to calibrate the spring constant of atomic force microscope cantilevers was described. The method involved a expression which relates the spring constant of any two cantilevers on the same chip. The measurement of the resonant frequency and the plain view surface area of the cantilevers was also required by the method. A limitation of this method was that the spring constant of one cantilever on the chip should be calculated accurately using another technique.
ASJC Scopus subject areas