Microscopy: Atomic Force Microscopy

C. J. Wright; L. C. Powell; D. J. Johnson; N. Hilal

doi:10.1016/B978-0-12-384730-0.00217-2

Microscopy: Atomic Force Microscopy

C. J. Wright, L. C. Powell, D. J. Johnson, N. Hilal

Research output: Chapter in Book/Report/Conference proceeding › Chapter

Abstract

Atomic force microscopy (AFM) is an essential tool for the characterization of microbial surfaces. AFM has been used extensively for imaging and nanoscale measurements of microbial surface features. In addition, the instrument's force measurement capability has provided unique insight into the interactions of microbial systems at the macromolecular, cell, and biofilm level. The chapter introduces the technology and describes the application of AFM in key research examples relevant to food microbiology. The chapter closes with a look to the future and how AFM is being integrated with established and emerging technologies for the improved study of food and microbial surfaces.

Original language	English (US)
Title of host publication	Encyclopedia of Food Microbiology
Subtitle of host publication	Second Edition
Publisher	Elsevier Inc.
Pages	666-675
Number of pages	10
ISBN (Electronic)	9780123847331
ISBN (Print)	9780123847300
DOIs	https://doi.org/10.1016/B978-0-12-384730-0.00217-2
State	Published - Apr 2 2014

Keywords

Atomic force microscopy
Biofilm
Colloid probe
Force measurement
Macromolecules
Mechanical properties
Nanoindentation
Nanoscience
Surface characterization
Viruses

ASJC Scopus subject areas

General Medicine

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10.1016/B978-0-12-384730-0.00217-2

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title = "Microscopy: Atomic Force Microscopy",

abstract = "Atomic force microscopy (AFM) is an essential tool for the characterization of microbial surfaces. AFM has been used extensively for imaging and nanoscale measurements of microbial surface features. In addition, the instrument's force measurement capability has provided unique insight into the interactions of microbial systems at the macromolecular, cell, and biofilm level. The chapter introduces the technology and describes the application of AFM in key research examples relevant to food microbiology. The chapter closes with a look to the future and how AFM is being integrated with established and emerging technologies for the improved study of food and microbial surfaces.",

keywords = "Atomic force microscopy, Biofilm, Colloid probe, Force measurement, Macromolecules, Mechanical properties, Nanoindentation, Nanoscience, Surface characterization, Viruses",

author = "Wright, {C. J.} and Powell, {L. C.} and Johnson, {D. J.} and N. Hilal",

year = "2014",

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doi = "10.1016/B978-0-12-384730-0.00217-2",

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T2 - Atomic Force Microscopy

AU - Wright, C. J.

AU - Powell, L. C.

AU - Johnson, D. J.

AU - Hilal, N.

PY - 2014/4/2

Y1 - 2014/4/2

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AB - Atomic force microscopy (AFM) is an essential tool for the characterization of microbial surfaces. AFM has been used extensively for imaging and nanoscale measurements of microbial surface features. In addition, the instrument's force measurement capability has provided unique insight into the interactions of microbial systems at the macromolecular, cell, and biofilm level. The chapter introduces the technology and describes the application of AFM in key research examples relevant to food microbiology. The chapter closes with a look to the future and how AFM is being integrated with established and emerging technologies for the improved study of food and microbial surfaces.

KW - Atomic force microscopy

KW - Biofilm

KW - Colloid probe

KW - Force measurement

KW - Macromolecules

KW - Mechanical properties

KW - Nanoindentation

KW - Nanoscience

KW - Surface characterization

KW - Viruses

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DO - 10.1016/B978-0-12-384730-0.00217-2

M3 - Chapter

AN - SCOPUS:84952906005

SN - 9780123847300

SP - 666

EP - 675

BT - Encyclopedia of Food Microbiology

PB - Elsevier Inc.

ER -

Microscopy: Atomic Force Microscopy

Abstract

Keywords

ASJC Scopus subject areas

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