TY - JOUR
T1 - Microstructural study of bronze-processed commercial multifilamentary superconducting Nb3Sn wires
AU - Hascicek, Y. S.
AU - Nourbakhsh, S.
AU - Goringe, M. J.
N1 - Funding Information:
The authors wish to thank Dr J. A. Lee and his colleagues at AERE Harwell for kindly providing the wire and for many helpful discussions. Provision of laboratory facilities by Professor Sir Peter Hirsch and financial support from the U.K. SERC (SN) and the Turkish Government (YSH) are gratefully acknowledged.
PY - 1989/4
Y1 - 1989/4
N2 - The thickness, morphology, grain size and grain morphology of A-15 diffusion layers in bronze-processed commercial multifilamentary superconducting Nb3Sn wire have been investigated using optical microscopy and transmission electron microscopy. The layer growth appears to be controlled by the availability of tin in the matrix, and the remanent tin concentration in the matrix depends on the reaction temperature. While there is some elongation of grains in the inner parts of the annular layers grown at lower temperatures, at high temperatures all the grains are equiaxed.
AB - The thickness, morphology, grain size and grain morphology of A-15 diffusion layers in bronze-processed commercial multifilamentary superconducting Nb3Sn wire have been investigated using optical microscopy and transmission electron microscopy. The layer growth appears to be controlled by the availability of tin in the matrix, and the remanent tin concentration in the matrix depends on the reaction temperature. While there is some elongation of grains in the inner parts of the annular layers grown at lower temperatures, at high temperatures all the grains are equiaxed.
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U2 - 10.1080/13642818908218390
DO - 10.1080/13642818908218390
M3 - Article
AN - SCOPUS:0024646956
SN - 1364-2812
VL - 59
SP - 405
EP - 422
JO - Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties
JF - Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties
IS - 4
ER -