Abstract
The authors describe a compact, low-temperature STM (scanning tunnelling microscopy) design whereby the scanning tip crosses a TE-mode K-band cavity at a high E-field region of the cavity, defined by an iris and a movable end-wall microwave plunger.
| Original language | English (US) |
|---|---|
| Article number | 014 |
| Pages (from-to) | 83-85 |
| Number of pages | 3 |
| Journal | Measurement Science and Technology |
| Volume | 2 |
| Issue number | 1 |
| DOIs | |
| State | Published - 1991 |
ASJC Scopus subject areas
- Instrumentation
- Engineering (miscellaneous)
- Applied Mathematics