@inproceedings{0abc1a1a3599433db6bb56ec975203df,
title = "Mitigating the power density and temperature problems in the nano-era",
abstract = "This paper introduces the power-density and temperature induced issues in the modern on-chip systems. In particular, the emerging Dark Silicon problem is discussed along with critical research challenges. Afterwards, an overview of key research efforts and concepts is presented that leverage dark silicon for performance and reliability optimization. In case temperature constraints are violated, an efficient dynamic thermal management technique is employed.",
keywords = "Aging, Boosting, Dark Silicon, Efficiency, Performance, Power, Power Density, Reliability, Soft Errors, Temperature",
author = "Muhammad Shafique and Jorg Henkel",
note = "Publisher Copyright: {\textcopyright} 2015 IEEE. Copyright: Copyright 2016 Elsevier B.V., All rights reserved.; 34th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2015 ; Conference date: 02-11-2015 Through 06-11-2015",
year = "2016",
month = jan,
day = "5",
doi = "10.1109/ICCAD.2015.7372567",
language = "English (US)",
series = "2015 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2015",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "176--177",
booktitle = "2015 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2015",
}