Abstract
An extension of the authors' work on perceptual image distortion is presented. The extended model accounts for (1) contrast sensitivity as a function of spatial frequency, mean luminance and spatial extent, (2) luminance masking, and (3) contrast masking. In a typical spatial pattern detection experiment, the contrast of a visual stimulus called the target is adjusted until it is just barely detectable. Threshold contrasts of the target are measured over a range of spatial frequencies, mean luminances, and spatial extents. The model consists of three main parts: a retinal component for contrast sensitivity, a cortical component for contrast masking, and a detection mechanism.
| Original language | English (US) |
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| Title of host publication | IEEE International Conference on Image Processing |
| Editors | Anon |
| Publisher | IEEE |
| Pages | 343-344 |
| Number of pages | 2 |
| Volume | 2 |
| State | Published - 1996 |
| Event | Proceedings of the 1995 IEEE International Conference on Image Processing. Part 3 (of 3) - Washington, DC, USA Duration: Oct 23 1995 → Oct 26 1995 |
Other
| Other | Proceedings of the 1995 IEEE International Conference on Image Processing. Part 3 (of 3) |
|---|---|
| City | Washington, DC, USA |
| Period | 10/23/95 → 10/26/95 |
ASJC Scopus subject areas
- Computer Vision and Pattern Recognition
- Hardware and Architecture
- Electrical and Electronic Engineering